Evidence for a linear low-voltage space-charge-limited current in organic thin films. Film thickness and temperature dependence in alpha-conjugated sexithienyl

نویسندگان

  • Gilles Horowitz
  • Denis Fichou
  • Xuezhou Peng
  • Philippe Delannoy
چکیده

2014 The current-voltage (I-V) characteristics of Au/03B1-sexithienyl/Au sandwich structures have been measured. The I-V curves present two regimes : at high voltages, the square law corresponding to the space-charge-limited current (SCLC) is observed ; the linear variation occurring at low voltages is generally attributed to the ohmic current due to bulk free-carriers. A study of the linear current as a function of the sample thickness shows that two behaviors are encountered. The standard model is followed on thick films, where the conductivity calculated from the slope of the I-V curve does not depend on the thickness. In thin films (less than 2 03BCm), a thickness dependent conductivity is obtained. This is explained within the frame of the model developed by Bonham and co-workers, in which the diffusion of carriers thermally injected is taken into account. The bulk density of these injected carriers increases when the thickness is reduced, and may become higher than that of bulk free-carriers already present in the film. Experimental results are in good agreement with the predictions of the model. The effective mobility of 03B1-sexithienyl (03B1-6T) could be calculated from the quadratic regime of the IV curves. Measurements as a function of temperature were also carried out. The mobility is found to be thermally stimulated, which is interpreted as due to a shallow trap located 0.3 eV above valence band edge. J. Phys. France 51 (1990) 1489-1499 ler JUILLET 1990, Classification Physics Abstracts 72.80L 73.60F Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/jphys:0199000510130148900

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

Dependence of Nanostructure and the Optical Properties of Ni Thin Films with Different Thicknesses on the Substrate Temperature

Nickel films with the thicknesses of 30 and 120 nm were deposited on glass substrates, at different substrate temperatures (313 to 600 K) under uhv condition. The nano-structure of the films and mean diameter of grains was obtained for each films using atomic force microscopy (AFM). Their optical properties were measured by spectrophotometry in the spectral range of 190-2500 nm. Kramers-Kronig ...

متن کامل

Thickness Dependence of Sensitivity in Thin Film Tin Oxide Gas Sensors Deposited by Vapor Pyrolysis

Transparent SnO2 thin films were deposited on porcelain substrates using a chemical vapor deposition technique based on the hydrolysis of SnCl4 at elevated temperatures. A reduced pressure self-contained evaporation chamber was designed for the process where the pyrolysis of SnCl4 at the presence of water vapor was carried out. Resistive gas sensors were fabricated by providing ohmic contacts o...

متن کامل

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

Light intensity, temperature, and thickness dependence of the open-circuit voltage in solid-state dye-sensitized solar cells

We present an analytical and experimental investigation into the origin of the open-circuit voltage in the solid-state dye-sensitized solar cell. Through Kelvin probe microscopy, we demonstrate that a macroscopically uniform electric field exists throughout the nanocomposite between the electrodes. Considering a balance between drift and diffusion currents, and between charge generation and rec...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2016